Marka laga hadlayo nidaamyada indhaha ee saxsan - laga bilaabo qalabka lithography ilaa qalabka laysarka - saxnaanta isku-xidhka ayaa go'aamisa waxqabadka nidaamka. Xulashada walxaha substrate-ka ee loogu talagalay goobaha isku-xidhka indhaha ma aha oo kaliya doorasho helitaan laakiin waa go'aan injineernimo oo muhiim ah oo saameeya saxnaanta cabbirka, xasilloonida kulaylka, iyo isku halaynta muddada-dheer. Falanqayntani waxay baareysaa shan qeexitaan oo muhiim ah oo ka dhigaya substrate-ka galaaska ee saxda ah doorashada la doorbidayo ee nidaamyada isku-xidhka indhaha, oo ay taageerayaan xogta tirada iyo dhaqamada ugu wanaagsan ee warshadaha.
Hordhac: Doorka Muhiimka ah ee Agabka Substrate-ka ee Iswaafajinta Indhaha
Tilmaamaha 1aad: Gudbinta Indhaha iyo Waxqabadka Muuqaalka
| Alaab | Gudbinta Muuqda (400-700 nm) | Gudbinta Ku Dhaw-IR (700-2500 nm) | Awoodda Qalafsanaanta Dusha Sare |
|---|---|---|---|
| N-BK7 | >95% | >95% | Ra ≤ 0.5 nm |
| Silica la isku daray | >95% | >95% | Ra ≤ 0.3 nm |
| Borofloat®33 | ~92% | ~90% | Ra ≤ 1.0 nm |
| AF 32® eco | ~93% | >93% | Ra < 1.0 nm RMS |
| Zeduror® | Lama arki karo (muuqaal ahaan ma muuqato) | Lama Helin | Ra ≤ 0.5 nm |
Tayada Dusha Sare iyo Kala-baxa:
Tilmaamaha 2: Fidsanaanta Dusha sare iyo Xasiloonida Cabbirka
| Tilmaamaha Fidsanaan | Fasalka Codsiga | Kiisaska Isticmaalka Caadiga ah |
|---|---|---|
| ≥1λ | Heerka ganacsiga | Iftiimin guud, iswaafajin aan muhiim ahayn |
| λ/4 | Heerka shaqada | Laysarro awood yar oo dhexdhexaad ah, nidaamyada sawir-qaadista |
| ≤λ/10 | darajada saxda ah | Laysarka awoodda sare leh, nidaamyada mitirka |
| ≤λ/20 | Aad u saxsan | Interferometry, lithography, isu imaatinka photonics |
Caqabadaha Wax Soo Saarka:
Faahfaahinta 3: Isku-darka Ballaarinta Kulaylka (CTE) iyo Xasilloonida Kulaylka
| CTE (×10⁻⁶/K) | Isbeddelka Cabbirka halkii °C | Isbeddelka Cabbirka Kala Duwanaanshaha 5°C kasta |
|---|---|---|
| 23 (Aluminium) | 4.6 μm | 23 μm |
| 7.2 (Birta) | 1.44 μm | 7.2 μm |
| 3.2 (AF 32® eco) | 0.64 μm | 3.2 μm |
| 0.05 (ULE®) | 0.01 μm | 0.05 μm |
| 0.007 (Zerodur®) | 0.0014 μm | 0.007 μm |
Fasallada Agabka ee CTE:
- CTE: 0 ± 0.05 × 10⁻⁶/K (ULE) ama 0 ± 0.007 × 10⁻⁶/K (Zerodur)
- Codsiyada: Interferometry sax ah oo aad u sarreeya, teleskoobyada hawada sare, muraayadaha tixraaca lithography
- Ganacsi: Kharash sare, gudbinta indhaha oo xaddidan oo ku jirta muuqaalka muuqda
- Tusaale: Muraayadda Hubble Space Telescope substrate waxay isticmaashaa galaaska ULE oo leh CTE < 0.01 × 10⁻⁶/K
- CTE: 3.2 × 10⁻⁶/K (si dhow ayuu ugu habboon yahay siliconka 3.4 × 10⁻⁶/K)
- Codsiyada: Baakadaha MEMS, isdhexgalka silicon photonics, tijaabada semiconductor
- Faa'iido: Waxay yareysaa cadaadiska kulaylka ee isku-xidhka isku-xidhka
- Waxqabadka: Waxay awood u siineysaa isku dheelitir la'aanta CTE ee ka hooseysa 5% iyadoo la adeegsanayo substrate-ka silicon.
- CTE: 7.1-8.2 × 10⁻⁶/K
- Codsiyada: Isku-dubaridka guud ee indhaha, shuruudaha saxda ah ee dhexdhexaadka ah
- Faa'iidada: Gudbinta indhaha oo aad u fiican, kharash yar
- Xaddidaadda: Waxay u baahan tahay xakamaynta heerkulka firfircoon ee codsiyada saxnaanta sare leh
Tilmaamaha 4: Sifooyinka Farsamada iyo Daminta Gariirka
| Alaab | Modulus-ka Young (GPa) | Adkayn Gaar ah (E/ρ, 10⁶ m) |
|---|---|---|
| Silica la isku daray | 72 | 32.6 |
| N-BK7 | 82 | 34.0 |
| AF 32® eco | 74.8 | 30.8 |
| Aluminium 6061 | 69 | 25.5 |
| Bir (440C) | 200 | 25.1 |
U fiirsasho: In kasta oo birtu ay leedahay adkaanta ugu sarreysa, haddana adkaanta gaarka ah (saamiga adkaanta iyo miisaanka) waxay la mid tahay aluminium. Agabka galaaska wuxuu bixiyaa adkaansho gaar ah oo la barbar dhigi karo biraha oo leh faa'iidooyin dheeraad ah: sifooyinka aan birlab ahayn iyo maqnaanshaha khasaaraha hadda jira.
- Go'doomin Soo noqnoqosho Yar: Waxaa bixiya go'doomiyayaal neef-mareen ah oo leh soo noqnoqosho soo noqnoqosho ah 1-3 Hz
- Damping-Mid-Frequency: Waxaa xakameeyay isku-dhafka gudaha ee substrate-ka iyo naqshadaynta qaab-dhismeedka
- Shaandhaynta Soo noqnoqoshada Sare: Waxaa lagu gaaraa rarista tirada badan iyo is-waafajinta iska caabbinta
- Heerkulka caadiga ah ee qaboojinta: 0.8 × Tg (heerkulka kala-guurka galaaska)
- Muddada qaboojinta: 4-8 saacadood oo dhumucdiisu tahay 25 mm (miisaan leh dhumuc labajibbaaran)
- Heerka qaboojinta: 1-5°C/saacaddii iyada oo loo marayo barta cadaadiska
Tilmaamaha 5: Xasiloonida Kiimikada iyo Iska caabinta Deegaanka
| Nooca Iska caabinta | Habka Tijaabada | Kala-soocidda | Xadka |
|---|---|---|---|
| Hawo-mareenka | ISO 719 | Fasalka 1aad | <10 μg Na₂O u dhiganta garaamkii |
| Asiidh | ISO 1776 | Fasalka A1-A4 | Miisaanka oo luma ka dib soo-gaadhista aashitada |
| Alkali | ISO 695 | Fasalka 1-2 | Miisaanka oo yaraada ka dib soo-gaadhista alkali |
| Cimilada | Soo-gaadhista dibadda | Aad u fiican | Ma jiro hoos u dhac la qiyaasi karo 10 sano kadib |
Iswaafajinta Nadiifinta:
- Khamriga isopropyl (IPA)
- Asetone
- Biyaha la dhalaaliyay
- Xalalka nadiifinta indhaha ee gaarka ah
- Silica la isku daray: < 10⁻¹⁰ Torr·L/s·cm²
- Borosilicate: < 10⁻⁹ Torr·L/s·cm²
- Aluminium: 10⁻⁸ – 10⁻⁷ Torr·L/s·cm²
- Silica la isku daray: Ma jirto khasaare gudbin oo la qiyaasi karo ilaa wadarta qiyaasta 10 krad
- N-BK7: Lumista gudbinta <1% 400 nm ka dib 1 krad
- Silica la isku daray: Xasiloonida cabbirka < 1 nm sannadkii xaaladaha shaybaarka caadiga ah
- Zeduror®: Xasillooni cabbireed < 0.1 nm sannadkii (sababtoo ah xasilinta wejiga kristalinta)
- Aluminium: Wareeg cabbir ah 10-100 nm sannadkii sababtoo ah nasashada walwalka iyo wareegga kuleylka
Qaab-dhismeedka Xulashada Agabka: Tilmaamaha Isku-waafajinta Codsiyada
Isku-dubaridka Saxnaanta Aad u Sareysa (≤10 nm sax ah)
- Fidsanaan: ≤ λ/20
- CTE: Ku dhawaad eber (≤0.05 × 10⁻⁶/K)
- Gudbinta: >95%
- Daminta gariirka: Khilaaf gudaha ah oo heer sare ah oo Q ah
- ULE® (Corning Code 7972): Codsiyada u baahan gudbinta la arki karo/NIR
- Zeduror®: Codsiyada aan loo baahnayn gudbinta muuqata
- Silica la isku daray (heer sare): Loogu talagalay codsiyada leh shuruudaha xasilloonida kulaylka dhexdhexaadka ah
- Marxaladaha isku-dubaridka Litography
- Cabbirka Interferometric
- Nidaamyada indhaha ee ku salaysan hawada sare
- Shirka sawir-qaadista saxda ah
Isku-dubarid Sare (saxnaanta 10-100 nm)
- Fidsanaan: λ/10 ilaa λ/20
- CTE: 0.5-5 × 10⁻⁶/K
- Gudbinta: >92%
- Iska caabin kiimiko oo wanaagsan
- Silica la isku daray: Waxqabad guud oo aad u fiican
- Borofloat®33: Iska caabbinta shoogga kulaylka oo wanaagsan, CTE dhexdhexaad ah
- AF 32® eco: CTE-ka u dhigma Silicon-ka ee is-dhexgalka MEMS
- Isku-dubaridka mashiinka laysarka
- Shirka Fiber Optic
- Kormeerka Semiconductor-ka
- Cilmi-baarista nidaamyada indhaha
Isku-dubaridka Guud ee Saxnaanta (saxnaanta 100-1000 nm)
- Fidsanaan: λ/4 ilaa λ/10
- CTE: 3-10 × 10⁻⁶/K
- Gudbinta: >90%
- Kharash-ool ah
- N-BK7: Muraayad caadi ah oo indhaha ah, gudbin aad u fiican
- Borofloat®33: Waxqabad kuleyl oo wanaagsan, kharash ka hooseeya silica la shiiday
- Galaas Soda-lime ah: Kharash ahaan waxtar u leh codsiyada aan muhiimka ahayn
- Aragtiyada waxbarashada
- Nidaamyada isku-dubaridka warshadaha
- Alaabada indhaha ee macaamiisha
- Qalabka shaybaarka guud
Tixgelinta Wax-soo-saarka: Gaaritaanka Shanta Tilmaamood ee Muhiimka ah
Geedi socodka Dhammaystirka Dusha Sare
- Shiidida Adag: Waxay ka saartaa walxaha badan, waxayna gaartaa dulqaad dhumuc leh ±0.05 mm
- Shiidid Fiican: Waxay yareysaa qallafsanaanta dusha sare ilaa Ra ≈ 0.1-0.5 μm
- Nadiifinta: Waxay gaartaa dhammaystirka dusha sare ee ugu dambeeya Ra ≤ 0.5 nm
- Fidsanaan joogto ah oo ku wareegsan substrate-ka 300-500 mm
- Waqtiga hawsha oo la dhimay 40-60%
- Awoodda lagu saxayo khaladaadka soo noqnoqda ee bartamaha-meelaha
- Heerkulka Qaboojinta: 0.8 × Tg (heerkulka kala-guurka galaaska)
- Waqtiga qoyan: 4-8 saacadood (miisaan leh dhumuc labajibbaaran)
- Heerka qaboojinta: 1-5°C/saacaddii iyada oo loo marayo barta cadaadiska
Hubinta Tayada iyo METrolojiga
- Interferometry: Zygo, Veeco, ama qalab laysar oo la mid ah oo leh saxnaan λ/100
- Mowjadda cabbirka: Caadiyan 632.8 nm (Layserka HeNe)
- Dalool: Dalool cad waa inuu ka badan yahay 85% dhexroorka substrate-ka
- Mikroskoobka Xoogga Atomiga (AFM): Loogu talagalay xaqiijinta Ra ≤ 0.5 nm
- Interferometry-ga Cad ee Iftiinka: Qalafsanaanta 0.5-5 nm
- Profilometry-ga Xiriirka: Si loo helo qallafsanaan > 5 nm
- Dilatometry: Cabbirka CTE ee caadiga ah, saxnaanta ±0.01 × 10⁻⁶/K
- Cabbirka CTE ee Interferometric: Agabka CTE ee aadka u hooseeya, saxnaanta ±0.001 × 10⁻⁶/K
- Fizeau interferometry: Si loo cabbiro isku-dhafka CTE ee ku baahsan substrate-yada waaweyn
Tixgelinta Isdhexgalka: Ku darista Substrate-ka Muraayadaha Nidaamyada Isku-dubaridka
Ku rakibidda iyo rakibidda
- Ku rakiban malab: Substrate-yada waaweyn, kuwa fudud ee u baahan adkaansho sare
- Qabsashada geeska: Loogu talagalay substrate-yada labada dhinacba ay tahay inay ahaadaan kuwo la heli karo
- Ku dhejiyo isku xiran: Isticmaalaya dhejis indhaha ah ama epoxies gaaska yareeya
Maareynta Kulaylka
- Saxnaanta xakamaynta: ±0.01°C shuruudaha fidsanaan λ/20
- Midaysanaan: < 0.01°C/mm oo ka sarraysa dusha sare ee substrate-ka
- Xasilloonida: Heerkulka oo hoos u dhacaya < 0.001°C/saacaddii inta lagu jiro hawlgallada muhiimka ah
- Gaashaannada kulaylka: Gaashaannada shucaaca ee lakabka badan leh oo leh dahaadh yar oo qiiqa ka soo baxa
- Dahaarka: Alaabada dahaarka kulaylka ee waxqabadka sare leh
- Cufka kulaylka: Isbeddellada heerkulka ee weyn ee kaydiya cufka kulaylka
Xakamaynta Deegaanka
- Soo saarista walxaha: < 100 walxood/ft³/daqiiqo (Qol nadiif ah oo fasalka 100 ah)
- Gaaska oo sii daaya: < 1 × 10⁻⁹ Torr·L/s·cm² (loogu talagalay isticmaalka faakuumka)
- Nadiifin: Waa inuu u adkeystaa nadiifinta IPA ee soo noqnoqda iyada oo aan la burburin
Falanqaynta Kharashka-Faa'iidada: Substrates-ka Muraayadaha iyo Beddelka
Isbarbardhigga Qiimaha Bilowga ah
| Qalabka Substrate-ka | 200 mm Dhexroor, 25 mm Dhumuc (USD) | Kharashka Qaraarka |
|---|---|---|
| Koob soodhaha-liin ah | $50-100 | 1 × |
| Borofloat®33 | $200-400 | 3-5 × |
| N-BK7 | $300-600 | 5-8 × |
| Silica la isku daray | $800-1,500 | 10-20 × |
| AF 32® eco | $500-900 | 8-12 × |
| Zeduror® | $2,000-4,000 | 30-60 × |
| ULE® | $3,000-6,000 | 50-100 × |
Falanqaynta Qiimaha Wareegga Nolosha
- Dusha sare ee galaaska: 5-10 sano oo cimri ah, dayactir yar
- Birta ku jirta: 2-5 sano oo cimri ah, dib-u-cusboonaysiin xilliyeed ayaa loo baahan yahay
- Substrate-ka balaastikada ah: 6-12 bilood oo cimri ah, beddel joogto ah
- Substrates-ka galaaska: Karti u yeelo saxnaanta isku-xidhka 2-10× si ka wanaagsan beddelka
- Birta hoosteeda: Waxaa xaddidaya xasilloonida kulaylka iyo burburka dusha sare
- Substrate-ka balaastikada ah: Waxaa xaddidaya gurguurta iyo xasaasiyadda deegaanka
- Gudbinta indhaha oo sareysa: 3-5% wareegyo isku-xirnaan oo dhakhso badan
- Xasillooni heerkul oo wanaagsan: Baahida loo qabo isku dheelitirka heerkulka oo yaraatay
- Dayactir hoose: Waqti yar oo shaqo ah oo dib loogu hagaajinayo
Isbeddellada Mustaqbalka: Tiknoolajiyada Muraayadaha Soo Baxaya ee Isku-xidhka Indhaha
Qalabka Muraayadaha ee la farsameeyay
- ULE® Loogu talagalay: Heerkulka CTE ee eber-isdhaafsan waxaa lagu qeexi karaa ±5°C
- Muraayadaha CTE ee Gradient-ka ah: Jaangooyo CTE ah oo la farsameeyay laga bilaabo dusha sare ilaa xudunta
- Kala duwanaanshaha CTE ee Gobolka: Qiimayaasha CTE ee kala duwan ee gobollada kala duwan ee isku substrate-ka
- Isdhexgalka hagaha hirarka: Qorista tooska ah ee hagaha hirarka ee ku jira substrate galaas ah
- Muraayadaha la qooyay: Muraayadaha lagu qooyay Erbium ama kuwa dhulka lagu qooyay ee naadirka ah ee loogu talagalay hawlaha firfircoon
- Muraayadaha aan tooska ahayn: Isku-dhafka sare ee aan tooska ahayn ee beddelka soo noqnoqda
Farsamooyinka Wax Soo Saarka Sare
- Joomatari adag oo aan macquul ahayn oo leh qaab dhaqameed
- Kanaalada qaboojinta ee isku dhafan ee maaraynta kulaylka
- Qashinka walxaha la dhimay ee qaababka gaarka ah
- Qaabaynta muraayadda saxda ah: Saxnaanta hoose ee dusha sare ee indhaha
- Ku foorarsiga mandrels-ka: Ku guuleyso qalooc la xakameeyey oo leh dhammaystir dusha sare Ra < 0.5 nm
Substrates-ka Muraayadaha Casriga ah
- Dareemayaasha heerkulka: La socodka heerkulka oo qaybsan
- Cabbiraadaha cadaadiska: Cabbirka cadaadiska/qaab-dhismeedka waqtiga-dhabta ah
- Dareemayaasha booska: Cabbirka isku dhafan ee is-hagaajinta
- Dhaqdhaqaaqa kulaylka: Kuleyliyeyaasha isku dhafan ee xakamaynta heerkulka firfircoon
- Dhaqaajinta Piezoelectric: Hagaajinta booska cabbirka Nanometer-ka
- Optics-ka la qabsiga leh: Saxitaanka sawirka dusha sare waqtiga dhabta ah
Gunaanad: Faa'iidooyinka Istaraatiijiyadeed ee Substrate-ka Muraayadda Saxda ah
Qaab-dhismeedka Go'aanka
- Saxnaanta Iswaafajinta Loo Baahan Yahay: Waxay go'aamisaa fidsanaanta iyo shuruudaha CTE
- Kala duwanaanshaha hirarka: Tilmaamaha qeexitaanka gudbinta indhaha
- Xaaladaha Deegaanka: Waxay saamaysaa baahiyaha CTE iyo xasilloonida kiimikada
- Mugga Wax Soo Saarka: Waxay saameysaa falanqaynta kharashka iyo faa'iidada
- Shuruudaha Sharciyeynta: Waxay ku qasbi kartaa agab gaar ah oo loogu talagalay shahaadada
Faa'iidada ZHHIMG
- Helitaanka agabka galaaska ee heerka sare ah ee soosaarayaasha hormuudka ka ah
- Tilmaamaha walxaha gaarka ah ee codsiyada gaarka ah
- Maareynta silsiladda sahayda si loo helo tayo joogto ah
- Qalabka shiidi iyo nadifinta ee casriga ah
- Nadiifinta kombiyuutarku ku shaqeeyo si loo helo fidsanaan λ/20
- METrology-ga gudaha si loo xaqiijiyo qeexitaanka
- Naqshadaynta substrate-ka ee codsiyada gaarka ah
- Xalalka rakibidda iyo rakibidda
- Isdhexgalka maaraynta kulaylka
- Kormeer dhammaystiran iyo shahaado
- Dukumentiyada la raadraaci karo
- U hoggaansanaanta heerarka warshadaha (ISO, ASTM, MIL-SPEC)
Waqtiga boostada: Maarso-17-2026
